CVE-2022-21176

HIGHCVSS 7.5/10EPSS 1.04%

Last modified

CVE-2022-21176 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. MMP: All versions prior to v1.0.3, PTP C-series: Device versions prior to v2.8.6.1, and PTMP C-series and A5x: Device versions prior to v2.5.4.1 does not properly sanitize user input, which may allow an attacker to perform a SQL injection and obtain sensitive information.. EPSS estimates a 1.04% chance of exploitation in the next 30 days.

Description

MMP: All versions prior to v1.0.3, PTP C-series: Device versions prior to v2.8.6.1, and PTMP C-series and A5x: Device versions prior to v2.5.4.1 does not properly sanitize user input, which may allow an attacker to perform a SQL injection and obtain sensitive information.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
1.04%

59.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AirspanMimosa Management Platform< 1.0.3
AirspanC6x Firmware< 2.8.6.1
AirspanC5x Firmware< 2.8.6.1
AirspanC5c Firmware< 2.8.6.1
AirspanA5x Firmware< 2.5.4.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-21176?
MMP: All versions prior to v1.0.3, PTP C-series: Device versions prior to v2.8.6.1, and PTMP C-series and A5x: Device versions prior to v2.5.4.1 does not properly sanitize user input, which may allow an attacker to perform a SQL injection and obtain sensitive information.
How severe is CVE-2022-21176?
CVE-2022-21176 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 1.04% probability of exploitation in the next 30 days.
How do I fix CVE-2022-21176?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-21176?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST