CVE-2022-22553

CRITICALCVSS 9.8/10EPSS 1.08%

Last modified

CVE-2022-22553 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. Dell EMC AppSync versions 3.9 to 4.3 contain an Improper Restriction of Excessive Authentication Attempts Vulnerability that can be exploited from UI and CLI. An adjacent unauthenticated attacker could potentially exploit this vulnerability, leading to password brute-forcing. EPSS estimates a 1.08% chance of exploitation in the next 30 days.

Description

Dell EMC AppSync versions 3.9 to 4.3 contain an Improper Restriction of Excessive Authentication Attempts Vulnerability that can be exploited from UI and CLI. An adjacent unauthenticated attacker could potentially exploit this vulnerability, leading to password brute-forcing. Account takeover is possible if weak passwords are used by users.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.08%

60.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
DellEmc Appsync< 4.4.0.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-22553?
Dell EMC AppSync versions 3.9 to 4.3 contain an Improper Restriction of Excessive Authentication Attempts Vulnerability that can be exploited from UI and CLI. An adjacent unauthenticated attacker could potentially exploit this vulnerability, leading to password brute-forcing. Account takeover is possible if weak passwords are used by users.
How severe is CVE-2022-22553?
CVE-2022-22553 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 1.08% probability of exploitation in the next 30 days.
How do I fix CVE-2022-22553?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-22553?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST