CVE-2022-22593

HIGHCVSS 7.8/10EPSS 1.39%

Last modified

CVE-2022-22593 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. A buffer overflow issue was addressed with improved memory handling. This issue is fixed in iOS 15.3 and iPadOS 15.3, watchOS 8.4, tvOS 15.3, Security Update 2022-001 Catalina, macOS Monterey 12.2, macOS Big Sur 11.6.3. EPSS estimates a 1.39% chance of exploitation in the next 30 days.

Description

A buffer overflow issue was addressed with improved memory handling. This issue is fixed in iOS 15.3 and iPadOS 15.3, watchOS 8.4, tvOS 15.3, Security Update 2022-001 Catalina, macOS Monterey 12.2, macOS Big Sur 11.6.3. A malicious application may be able to execute arbitrary code with kernel privileges.

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
1.39%

68.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AppleIpados< 15.3
AppleIphone Os< 15.3
AppleMac Os X< 10.15.7
AppleMac Os X10.15.7
AppleMacos>= 11.0, < 11.6.3
AppleMacos>= 12.0.0, < 12.2
AppleTvos< 15.3
AppleWatchos< 8.4

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-22593?
A buffer overflow issue was addressed with improved memory handling. This issue is fixed in iOS 15.3 and iPadOS 15.3, watchOS 8.4, tvOS 15.3, Security Update 2022-001 Catalina, macOS Monterey 12.2, macOS Big Sur 11.6.3. A malicious application may be able to execute arbitrary code with kernel privileges.
How severe is CVE-2022-22593?
CVE-2022-22593 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 1.39% probability of exploitation in the next 30 days.
How do I fix CVE-2022-22593?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-22593?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST