CVE-2022-25645

HIGHCVSS 8.1/10EPSS 1.76%

Last modified

CVE-2022-25645 is a high-severity vulnerability rated 8.1/10 on the CVSS scale. All versions of package dset are vulnerable to Prototype Pollution via 'dset/merge' mode, as the dset function checks for prototype pollution by validating if the top-level path contains __proto__, constructor or protorype. By crafting a malicious object, it is possible to bypass this check and achieve prototype pollution.. EPSS estimates a 1.76% chance of exploitation in the next 30 days.

Description

All versions of package dset are vulnerable to Prototype Pollution via 'dset/merge' mode, as the dset function checks for prototype pollution by validating if the top-level path contains __proto__, constructor or protorype. By crafting a malicious object, it is possible to bypass this check and achieve prototype pollution.

Metrics

CVSS 3.1
8.1/10

CVSS:3.1/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.76%

75.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
Dset ProjectDsetAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-25645?
All versions of package dset are vulnerable to Prototype Pollution via 'dset/merge' mode, as the dset function checks for prototype pollution by validating if the top-level path contains __proto__, constructor or protorype. By crafting a malicious object, it is possible to bypass this check and achieve prototype pollution.
How severe is CVE-2022-25645?
CVE-2022-25645 has a CVSS score of 8.1/10 (HIGH severity). The EPSS model estimates a 1.76% probability of exploitation in the next 30 days.
How do I fix CVE-2022-25645?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-25645?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST