CVE-2022-27525

HIGHCVSS 7.8/10EPSS 1.60%

Last modified

CVE-2022-27525 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. A malicious crafted .dwf or .pct file when consumed through DesignReview.exe application could lead to memory corruption vulnerability by write access violation. This vulnerability in conjunction with other vulnerabilities could lead to code execution in the context of the current process.. EPSS estimates a 1.60% chance of exploitation in the next 30 days.

Description

A malicious crafted .dwf or .pct file when consumed through DesignReview.exe application could lead to memory corruption vulnerability by write access violation. This vulnerability in conjunction with other vulnerabilities could lead to code execution in the context of the current process.

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
1.60%

72.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AutodeskDesign Review2011
AutodeskDesign Review2012
AutodeskDesign Review2013
AutodeskDesign Review2017
AutodeskDesign Review2018

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-27525?
A malicious crafted .dwf or .pct file when consumed through DesignReview.exe application could lead to memory corruption vulnerability by write access violation. This vulnerability in conjunction with other vulnerabilities could lead to code execution in the context of the current process.
How severe is CVE-2022-27525?
CVE-2022-27525 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 1.60% probability of exploitation in the next 30 days.
How do I fix CVE-2022-27525?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-27525?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST