CVE-2022-27640

MEDIUMCVSS 6.5/10EPSS 0.35%

Last modified

CVE-2022-27640 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. A vulnerability has been identified in SIMATIC CP 442-1 RNA (All versions < V1.5.18), SIMATIC CP 443-1 RNA (All versions < V1.5.18). The affected devices improperly handles excessive ARP broadcast requests. EPSS estimates a 0.35% chance of exploitation in the next 30 days.

Description

A vulnerability has been identified in SIMATIC CP 442-1 RNA (All versions < V1.5.18), SIMATIC CP 443-1 RNA (All versions < V1.5.18). The affected devices improperly handles excessive ARP broadcast requests. This could allow an attacker to create a denial of service condition by performing ARP storming attacks, which can cause the device to reboot.

Metrics

CVSS 3.1
6.5/10

CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.35%

27.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SiemensSimatic Cp 442-1 Rna Firmware< 1.5.18
SiemensSimatic Cp 443-1 Rna Firmware< 1.5.18

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-27640?
A vulnerability has been identified in SIMATIC CP 442-1 RNA (All versions < V1.5.18), SIMATIC CP 443-1 RNA (All versions < V1.5.18). The affected devices improperly handles excessive ARP broadcast requests. This could allow an attacker to create a denial of service condition by performing ARP storming attacks, which can cause the device to reboot.
How severe is CVE-2022-27640?
CVE-2022-27640 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.35% probability of exploitation in the next 30 days.
How do I fix CVE-2022-27640?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-27640?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST