CVE-2022-28214

HIGHCVSS 7.8/10EPSS 0.17%

Last modified

CVE-2022-28214 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. During an update of SAP BusinessObjects Enterprise, Central Management Server (CMS) - versions 420, 430, authentication credentials are being exposed in Sysmon event logs. This Information Disclosure could cause a high impact on systems’ Confidentiality, Integrity, and Availability.. EPSS estimates a 0.17% chance of exploitation in the next 30 days.

Description

During an update of SAP BusinessObjects Enterprise, Central Management Server (CMS) - versions 420, 430, authentication credentials are being exposed in Sysmon event logs. This Information Disclosure could cause a high impact on systems’ Confidentiality, Integrity, and Availability.

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.17%

6.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SapBusinessobjects420
SapBusinessobjects430
SapBusinessobjects Business Intelligence420
SapBusinessobjects Business Intelligence430

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-28214?
During an update of SAP BusinessObjects Enterprise, Central Management Server (CMS) - versions 420, 430, authentication credentials are being exposed in Sysmon event logs. This Information Disclosure could cause a high impact on systems’ Confidentiality, Integrity, and Availability.
How severe is CVE-2022-28214?
CVE-2022-28214 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.17% probability of exploitation in the next 30 days.
How do I fix CVE-2022-28214?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-28214?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST