CVE-2022-3089

CRITICALCVSS 9.8/10EPSS 0.25%

Last modified

CVE-2022-3089 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. Echelon SmartServer 2.2 with i.LON Vision 2.2 stores cleartext credentials in a file, which could allow an attacker to obtain cleartext usernames and passwords of the SmartServer. If the attacker obtains the file, then the credentials could be used to control the web user interface and file transfer protocol (FTP) server. EPSS estimates a 0.25% chance of exploitation in the next 30 days.

Description

Echelon SmartServer 2.2 with i.LON Vision 2.2 stores cleartext credentials in a file, which could allow an attacker to obtain cleartext usernames and passwords of the SmartServer. If the attacker obtains the file, then the credentials could be used to control the web user interface and file transfer protocol (FTP) server.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.25%

16.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
EchelonI.Lon Vision2.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-3089?
Echelon SmartServer 2.2 with i.LON Vision 2.2 stores cleartext credentials in a file, which could allow an attacker to obtain cleartext usernames and passwords of the SmartServer. If the attacker obtains the file, then the credentials could be used to control the web user interface and file transfer protocol (FTP) server.
How severe is CVE-2022-3089?
CVE-2022-3089 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 0.25% probability of exploitation in the next 30 days.
How do I fix CVE-2022-3089?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-3089?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST