CVE-2022-32870
LOWCVSS 2.4/10EPSS 0.41%
Last modified
CVE-2022-32870 is a low-severity vulnerability rated 2.4/10 on the CVSS scale. A logic issue was addressed with improved state management. This issue is fixed in iOS 16, macOS Ventura 13, watchOS 9. EPSS estimates a 0.41% chance of exploitation in the next 30 days.
Description
A logic issue was addressed with improved state management. This issue is fixed in iOS 16, macOS Ventura 13, watchOS 9. A user with physical access to a device may be able to use Siri to obtain some call history information.
Metrics
CVSS:3.1/AV:P/AC:L/PR:N/UI:N/S:U/C:L/I:N/A:N
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Apple | Iphone Os | < 16.0 |
| Apple | Macos | < 13.0 |
| Apple | Watchos | < 9.0 |
References
- https://support.apple.com/en-us/HT213446Release Notes, Vendor Advisory
- https://support.apple.com/en-us/HT213486Release Notes, Vendor Advisory
- https://support.apple.com/en-us/HT213488Release Notes, Vendor Advisory
- https://support.apple.com/en-us/HT213446Release Notes, Vendor Advisory
- https://support.apple.com/en-us/HT213486Release Notes, Vendor Advisory
- https://support.apple.com/en-us/HT213488Release Notes, Vendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2022-32870?
A logic issue was addressed with improved state management. This issue is fixed in iOS 16, macOS Ventura 13, watchOS 9. A user with physical access to a device may be able to use Siri to obtain some call history information.
How severe is CVE-2022-32870?
CVE-2022-32870 has a CVSS score of 2.4/10 (LOW severity). The EPSS model estimates a 0.41% probability of exploitation in the next 30 days.
How do I fix CVE-2022-32870?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2022-32870?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST