CVE-2022-3349

MEDIUMCVSS 6.8/10EPSS 0.50%

Last modified

CVE-2022-3349 is a medium-severity vulnerability rated 6.8/10 on the CVSS scale. A vulnerability was found in Sony PS4 and PS5. It has been classified as critical. EPSS estimates a 0.50% chance of exploitation in the next 30 days.

Description

A vulnerability was found in Sony PS4 and PS5. It has been classified as critical. This affects the function UVFAT_readupcasetable of the component exFAT Handler. The manipulation of the argument dataLength leads to heap-based buffer overflow. It is possible to launch the attack on the physical device. It is recommended to upgrade the affected component. The associated identifier of this vulnerability is VDB-209679.

Metrics

CVSS 3.1
6.8/10

CVSS:3.1/AV:P/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.50%

38.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SonyPlaystation 4 FirmwareAll versions
SonyPlaystation 5 FirmwareAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-3349?
A vulnerability was found in Sony PS4 and PS5. It has been classified as critical. This affects the function UVFAT_readupcasetable of the component exFAT Handler. The manipulation of the argument dataLength leads to heap-based buffer overflow. It is possible to launch the attack on the physical device. It is recommended to upgrade the affected component. The associated identifier of this vulnerability is VDB-209679.
How severe is CVE-2022-3349?
CVE-2022-3349 has a CVSS score of 6.8/10 (MEDIUM severity). The EPSS model estimates a 0.50% probability of exploitation in the next 30 days.
How do I fix CVE-2022-3349?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-3349?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST