CVE-2022-34850

Name: CVE-2022-34850
Creator: NVD / NIST
Published: 2022-10-25T17:15:53.623+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 7.2/10EPSS 3.38%

Last modified Jun 17, 2026

CVE-2022-34850 is a high-severity vulnerability rated 7.2/10 on the CVSS scale. An OS command injection vulnerability exists in the web_server /action/import_authorized_keys/ functionality of Robustel R1510 3.1.16 and 3.3.0. A specially-crafted network request can lead to arbitrary command execution. EPSS estimates a 3.38% chance of exploitation in the next 30 days.

Description

An OS command injection vulnerability exists in the web_server /action/import_authorized_keys/ functionality of Robustel R1510 3.1.16 and 3.3.0. A specially-crafted network request can lead to arbitrary command execution. An attacker can send a sequence of requests to trigger this vulnerability.

Metrics

CVSS 3.1

7.2/10

CVSS:3.1/AV:N/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

3.38%

87.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-78

Affected Software

Vendor	Product	Versions
Robustel	R1510 Firmware	3.1.16
Robustel	R1510 Firmware	3.3.0

References

https://talosintelligence.com/vulnerability_reports/TALOS-2022-1578Exploit, Third Party Advisory
https://talosintelligence.com/vulnerability_reports/TALOS-2022-1578Exploit, Third Party Advisory

Timeline

Published: Oct 25, 2022
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2022-34850?

How severe is CVE-2022-34850?

CVE-2022-34850 has a CVSS score of 7.2/10 (HIGH severity). The EPSS model estimates a 3.38% probability of exploitation in the next 30 days.

How do I fix CVE-2022-34850?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-34850?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST