CVE-2022-38155
HIGHCVSS 7.5/10EPSS 0.88%
Last modified
CVE-2022-38155 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.. EPSS estimates a 0.88% chance of exploitation in the next 30 days.
Description
TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
Metrics
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Samsung | Mtower | <= 0.3.0 |
References
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api.c#L314Exploit, Third Party Advisory
- https://github.com/Samsung/mTower/issues/74Exploit, Issue Tracking, Third Party Advisory
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api.c#L314Exploit, Third Party Advisory
- https://github.com/Samsung/mTower/issues/74Exploit, Issue Tracking, Third Party Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2022-38155?
TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
How severe is CVE-2022-38155?
CVE-2022-38155 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.88% probability of exploitation in the next 30 days.
How do I fix CVE-2022-38155?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2022-38155?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
