CVE-2022-41489

HIGHCVSS 8.1/10EPSS 0.40%

Last modified

CVE-2022-41489 is a high-severity vulnerability rated 8.1/10 on the CVSS scale. WAYOS LQ_09 22.03.17V was discovered to contain a Cross-Site Request Forgery (CSRF) which allows attackers to send crafted requests to the server from the affected device. This vulnerability is exploitable due to a lack of authentication in the component Usb_upload.htm.. EPSS estimates a 0.40% chance of exploitation in the next 30 days.

Description

WAYOS LQ_09 22.03.17V was discovered to contain a Cross-Site Request Forgery (CSRF) which allows attackers to send crafted requests to the server from the affected device. This vulnerability is exploitable due to a lack of authentication in the component Usb_upload.htm.

Metrics

CVSS 3.1
8.1/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:R/S:U/C:N/I:H/A:H

EPSS Probability
0.40%

31.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
WayosLq-09 Firmware22.03.17
WayosLq-08 Firmware22.03.17
WayosLq-07 Firmware22.03.17
WayosLq-06 Firmware22.03.17
WayosLq-05 Firmware22.03.17
WayosLq-04 Firmware22.03.17

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-41489?
WAYOS LQ_09 22.03.17V was discovered to contain a Cross-Site Request Forgery (CSRF) which allows attackers to send crafted requests to the server from the affected device. This vulnerability is exploitable due to a lack of authentication in the component Usb_upload.htm.
How severe is CVE-2022-41489?
CVE-2022-41489 has a CVSS score of 8.1/10 (HIGH severity). The EPSS model estimates a 0.40% probability of exploitation in the next 30 days.
How do I fix CVE-2022-41489?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-41489?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST