CVE-2022-4166

MEDIUMCVSS 6.5/10EPSS 0.85%

Last modified

CVE-2022-4166 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. The Contest Gallery WordPress plugin before 19.1.5.1, Contest Gallery Pro WordPress plugin before 19.1.5.1 do not escape the addCountS POST parameter before concatenating it to an SQL query in 4_activate.php. This may allow malicious users with at least author privilege to leak sensitive information from the site's database.. EPSS estimates a 0.85% chance of exploitation in the next 30 days.

Description

The Contest Gallery WordPress plugin before 19.1.5.1, Contest Gallery Pro WordPress plugin before 19.1.5.1 do not escape the addCountS POST parameter before concatenating it to an SQL query in 4_activate.php. This may allow malicious users with at least author privilege to leak sensitive information from the site's database.

Metrics

CVSS 3.1
6.5/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.85%

53.6th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
Contest-GalleryContest Gallery< 19.1.5.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-4166?
The Contest Gallery WordPress plugin before 19.1.5.1, Contest Gallery Pro WordPress plugin before 19.1.5.1 do not escape the addCountS POST parameter before concatenating it to an SQL query in 4_activate.php. This may allow malicious users with at least author privilege to leak sensitive information from the site's database.
How severe is CVE-2022-4166?
CVE-2022-4166 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.85% probability of exploitation in the next 30 days.
How do I fix CVE-2022-4166?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-4166?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST