Strix
26.1K

CVE-2022-41717

MEDIUMCVSS 5.3/10EPSS 5.62%

Last modified

CVE-2022-41717 is a medium-severity vulnerability rated 5.3/10 on the CVSS scale. An attacker can cause excessive memory growth in a Go server accepting HTTP/2 requests. HTTP/2 server connections contain a cache of HTTP header keys sent by the client. EPSS estimates a 5.62% chance of exploitation in the next 30 days.

Description

An attacker can cause excessive memory growth in a Go server accepting HTTP/2 requests. HTTP/2 server connections contain a cache of HTTP header keys sent by the client. While the total number of entries in this cache is capped, an attacker sending very large keys can cause the server to allocate approximately 64 MiB per open connection.

Metrics

CVSS 3.1
5.3/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:L

EPSS Probability
5.62%

92.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GolangGo< 1.18.9
GolangGo>= 1.19.0, < 1.19.4
GolangHttp2< 0.4.0
FedoraprojectFedora37
FedoraprojectFedora38

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-41717?
An attacker can cause excessive memory growth in a Go server accepting HTTP/2 requests. HTTP/2 server connections contain a cache of HTTP header keys sent by the client. While the total number of entries in this cache is capped, an attacker sending very large keys can cause the server to allocate approximately 64 MiB per open connection.
How severe is CVE-2022-41717?
CVE-2022-41717 has a CVSS score of 5.3/10 (MEDIUM severity). The EPSS model estimates a 5.62% probability of exploitation in the next 30 days.
How do I fix CVE-2022-41717?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-41717?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST