CVE-2022-4229

CRITICALCVSS 9.8/10EPSS 0.90%

Last modified

CVE-2022-4229 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. A vulnerability classified as critical was found in SourceCodester Book Store Management System 1.0. This vulnerability affects unknown code of the file /bsms_ci/index.php. EPSS estimates a 0.90% chance of exploitation in the next 30 days.

Description

A vulnerability classified as critical was found in SourceCodester Book Store Management System 1.0. This vulnerability affects unknown code of the file /bsms_ci/index.php. The manipulation leads to improper access controls. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used. The identifier of this vulnerability is VDB-214588.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.90%

55.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
Book Store Management System ProjectBook Store Management System1.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-4229?
A vulnerability classified as critical was found in SourceCodester Book Store Management System 1.0. This vulnerability affects unknown code of the file /bsms_ci/index.php. The manipulation leads to improper access controls. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used. The identifier of this vulnerability is VDB-214588.
How severe is CVE-2022-4229?
CVE-2022-4229 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 0.90% probability of exploitation in the next 30 days.
How do I fix CVE-2022-4229?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-4229?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST