CVE-2022-43597

HIGHCVSS 8.1/10EPSS 1.85%

Last modified

CVE-2022-43597 is a high-severity vulnerability rated 8.1/10 on the CVSS scale. Multiple memory corruption vulnerabilities exist in the IFFOutput alignment padding functionality of OpenImageIO Project OpenImageIO v2.4.4.2. A specially crafted ImageOutput Object can lead to arbitrary code execution. EPSS estimates a 1.85% chance of exploitation in the next 30 days.

Description

Multiple memory corruption vulnerabilities exist in the IFFOutput alignment padding functionality of OpenImageIO Project OpenImageIO v2.4.4.2. A specially crafted ImageOutput Object can lead to arbitrary code execution. An attacker can provide malicious input to trigger these vulnerabilities.This vulnerability arises when the `m_spec.format` is `TypeDesc::UINT8`.

Metrics

CVSS 3.1
8.1/10

CVSS:3.1/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.85%

76.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
OpenimageioOpenimageio2.4.4.2
DebianDebian Linux11.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-43597?
Multiple memory corruption vulnerabilities exist in the IFFOutput alignment padding functionality of OpenImageIO Project OpenImageIO v2.4.4.2. A specially crafted ImageOutput Object can lead to arbitrary code execution. An attacker can provide malicious input to trigger these vulnerabilities.This vulnerability arises when the `m_spec.format` is `TypeDesc::UINT8`.
How severe is CVE-2022-43597?
CVE-2022-43597 has a CVSS score of 8.1/10 (HIGH severity). The EPSS model estimates a 1.85% probability of exploitation in the next 30 days.
How do I fix CVE-2022-43597?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-43597?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST