CVE-2022-49102

MEDIUMCVSS 5.5/10EPSS 0.22%

Last modified

CVE-2022-49102 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In the Linux kernel, the following vulnerability has been resolved: habanalabs: fix possible memory leak in MMU DR fini This patch fixes what seems to be copy paste error. We will have a memory leak if the host-resident shadow is NULL (which will likely happen as the DR and HR are not dependent).. EPSS estimates a 0.22% chance of exploitation in the next 30 days.

Description

In the Linux kernel, the following vulnerability has been resolved: habanalabs: fix possible memory leak in MMU DR fini This patch fixes what seems to be copy paste error. We will have a memory leak if the host-resident shadow is NULL (which will likely happen as the DR and HR are not dependent).

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.22%

12.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxLinux Kernel< 5.15.34
LinuxLinux Kernel>= 5.16, < 5.16.20
LinuxLinux Kernel>= 5.17, < 5.17.3

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-49102?
In the Linux kernel, the following vulnerability has been resolved: habanalabs: fix possible memory leak in MMU DR fini This patch fixes what seems to be copy paste error. We will have a memory leak if the host-resident shadow is NULL (which will likely happen as the DR and HR are not dependent).
How severe is CVE-2022-49102?
CVE-2022-49102 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.22% probability of exploitation in the next 30 days.
How do I fix CVE-2022-49102?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-49102?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST