CVE-2022-50324

MEDIUMCVSS 5.5/10EPSS 0.15%

Last modified

CVE-2022-50324 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In the Linux kernel, the following vulnerability has been resolved: mtd: maps: pxa2xx-flash: fix memory leak in probe Free 'info' upon remapping error to avoid a memory leak. [<miquel.raynal@bootlin.com>: Reword the commit log]. EPSS estimates a 0.15% chance of exploitation in the next 30 days.

Description

In the Linux kernel, the following vulnerability has been resolved: mtd: maps: pxa2xx-flash: fix memory leak in probe Free 'info' upon remapping error to avoid a memory leak. [<miquel.raynal@bootlin.com>: Reword the commit log]

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.15%

4.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxLinux Kernel>= 2.6.24, < 4.9.337
LinuxLinux Kernel>= 4.10, < 4.14.303
LinuxLinux Kernel>= 4.15, < 4.19.270
LinuxLinux Kernel>= 4.20, < 5.4.229
LinuxLinux Kernel>= 5.5, < 5.10.163
LinuxLinux Kernel>= 5.11, < 5.15.86
LinuxLinux Kernel>= 5.16, < 6.0.16
LinuxLinux Kernel>= 6.1, < 6.1.2

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2022-50324?
In the Linux kernel, the following vulnerability has been resolved: mtd: maps: pxa2xx-flash: fix memory leak in probe Free 'info' upon remapping error to avoid a memory leak. [<miquel.raynal@bootlin.com>: Reword the commit log]
How severe is CVE-2022-50324?
CVE-2022-50324 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.15% probability of exploitation in the next 30 days.
How do I fix CVE-2022-50324?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-50324?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST