CVE-2023-21517

Name: CVE-2023-21517
Creator: NVD / NIST
Published: 2023-06-28T21:15:09.557+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

CRITICALCVSS 9.8/10EPSS 1.60%

Last modified Jun 17, 2026

CVE-2023-21517 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.. EPSS estimates a 1.60% chance of exploitation in the next 30 days.

Description

Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.

Metrics

CVSS 3.1

9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

1.60%

72.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Vendor	Product	Versions
Samsung	Exynos	All versions

References

https://security.samsungmobile.com/securityUpdate.smsb?year=2023&month=06Vendor Advisory
https://security.samsungmobile.com/securityUpdate.smsb?year=2023&month=06Vendor Advisory

Timeline

Published: Jun 28, 2023
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2023-21517?

Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.

How severe is CVE-2023-21517?

CVE-2023-21517 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 1.60% probability of exploitation in the next 30 days.

How do I fix CVE-2023-21517?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-21517?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST