CVE-2023-24033

CRITICALCVSS 9.8/10EPSS 34.30%

Last modified

CVE-2023-24033 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. The Samsung Exynos Modem 5123, Exynos Modem 5300, Exynos 980, Exynos 1080, and Exynos Auto T512 baseband modem chipsets do not properly check format types specified by the Session Description Protocol (SDP) module, which can lead to a denial of service.. EPSS estimates a 34.30% chance of exploitation in the next 30 days.

Description

The Samsung Exynos Modem 5123, Exynos Modem 5300, Exynos 980, Exynos 1080, and Exynos Auto T512 baseband modem chipsets do not properly check format types specified by the Session Description Protocol (SDP) module, which can lead to a denial of service.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
34.30%

98.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SamsungExynos Modem 5300 FirmwareAll versions
SamsungExynos Modem 5123 FirmwareAll versions
SamsungExynos 980 FirmwareAll versions
SamsungExynos 1080 FirmwareAll versions
SamsungExynos Auto T5123 FirmwareAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-24033?
The Samsung Exynos Modem 5123, Exynos Modem 5300, Exynos 980, Exynos 1080, and Exynos Auto T512 baseband modem chipsets do not properly check format types specified by the Session Description Protocol (SDP) module, which can lead to a denial of service.
How severe is CVE-2023-24033?
CVE-2023-24033 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 34.30% probability of exploitation in the next 30 days.
How do I fix CVE-2023-24033?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-24033?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST