CVE-2023-24549

Name: CVE-2023-24549
Creator: NVD / NIST
Published: 2023-02-14T11:15:14.88+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 7.8/10EPSS 0.22%

Last modified Jun 17, 2026

CVE-2023-24549 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. A vulnerability has been identified in Solid Edge SE2022 (All versions < V222.0MP12), Solid Edge SE2023 (All versions < V223.0Update2). The affected application is vulnerable to stack-based buffer while parsing specially crafted PAR files. EPSS estimates a 0.22% chance of exploitation in the next 30 days.

Description

A vulnerability has been identified in Solid Edge SE2022 (All versions < V222.0MP12), Solid Edge SE2023 (All versions < V223.0Update2). The affected application is vulnerable to stack-based buffer while parsing specially crafted PAR files. An attacker could leverage this vulnerability to execute code in the context of the current process.

Metrics

CVSS 3.1

7.8/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability

0.22%

12.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-121

Affected Software

Vendor	Product	Versions
Siemens	Solid Edge Se2023	< 2210.0002.004

References

https://cert-portal.siemens.com/productcert/pdf/ssa-491245.pdfVendor Advisory
https://cert-portal.siemens.com/productcert/pdf/ssa-491245.pdfVendor Advisory

Timeline

Published: Feb 14, 2023
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2023-24549?

How severe is CVE-2023-24549?

CVE-2023-24549 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.22% probability of exploitation in the next 30 days.

How do I fix CVE-2023-24549?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-24549?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST