CVE-2023-28649

HIGHCVSS 7.5/10EPSS 0.52%

Last modified

CVE-2023-28649 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. The Hub in the Snap One OvrC cloud platform is a device used to centralize and manage nested devices connected to it. A vulnerability exists in which an attacker could impersonate a hub and send device requests to claim already claimed devices. EPSS estimates a 0.52% chance of exploitation in the next 30 days.

Description

The Hub in the Snap One OvrC cloud platform is a device used to centralize and manage nested devices connected to it. A vulnerability exists in which an attacker could impersonate a hub and send device requests to claim already claimed devices. The OvrC cloud platform receives the requests but does not validate if the found devices are already managed by another user.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:H/A:N

EPSS Probability
0.52%

39.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SnaponeOrvc< 7.3.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-28649?
The Hub in the Snap One OvrC cloud platform is a device used to centralize and manage nested devices connected to it. A vulnerability exists in which an attacker could impersonate a hub and send device requests to claim already claimed devices. The OvrC cloud platform receives the requests but does not validate if the found devices are already managed by another user.
How severe is CVE-2023-28649?
CVE-2023-28649 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.52% probability of exploitation in the next 30 days.
How do I fix CVE-2023-28649?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-28649?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST