CVE-2023-30668
HIGHCVSS 7.8/10EPSS 0.18%
Last modified
CVE-2023-30668 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. Out-of-bounds Write in BuildOemSecureSimLockResponse of libsec-ril prior to SMR Jul-2023 Release 1 allows local attacker to execute arbitrary code.. EPSS estimates a 0.18% chance of exploitation in the next 30 days.
Description
Out-of-bounds Write in BuildOemSecureSimLockResponse of libsec-ril prior to SMR Jul-2023 Release 1 allows local attacker to execute arbitrary code.
Metrics
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Weakness Enumeration
Affected Software
| Vendor | Product | Versions | Update |
|---|---|---|---|
| Samsung | Android | 11.0 | Smr-Apr-2021-R1 |
| Samsung | Android | 12.0 | Smr-Apr-2022-R1 |
| Samsung | Android | 13.0 | Smr-Apr-2023-R1 |
References
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2023-30668?
Out-of-bounds Write in BuildOemSecureSimLockResponse of libsec-ril prior to SMR Jul-2023 Release 1 allows local attacker to execute arbitrary code.
How severe is CVE-2023-30668?
CVE-2023-30668 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.18% probability of exploitation in the next 30 days.
How do I fix CVE-2023-30668?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
- Autonomous PentestingAI agents that find and validate exploitable vulnerabilities like this one across your applications.
- PR ReviewsPentest every pull request so vulnerable code is caught before it ships to production.
- AI Penetration TestingHow AI-driven penetration testing continuously covers your attack surface.
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Are you affected by CVE-2023-30668?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST