CVE-2023-32522

HIGHCVSS 8.1/10EPSS 3.32%

Last modified

CVE-2023-32522 is a high-severity vulnerability rated 8.1/10 on the CVSS scale. A path traversal exists in a specific dll of Trend Micro Mobile Security (Enterprise) 9.8 SP5 which could allow an authenticated remote attacker to delete arbitrary files. Please note: an attacker must first obtain the ability to execute low-privileged code on the target system in order to exploit this vulnerability.. EPSS estimates a 3.32% chance of exploitation in the next 30 days.

Description

A path traversal exists in a specific dll of Trend Micro Mobile Security (Enterprise) 9.8 SP5 which could allow an authenticated remote attacker to delete arbitrary files. Please note: an attacker must first obtain the ability to execute low-privileged code on the target system in order to exploit this vulnerability.

Metrics

CVSS 3.1
8.1/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:N/I:H/A:H

EPSS Probability
3.32%

87.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersionsUpdate
TrendmicroMobile Security9.8Sp5

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-32522?
A path traversal exists in a specific dll of Trend Micro Mobile Security (Enterprise) 9.8 SP5 which could allow an authenticated remote attacker to delete arbitrary files. Please note: an attacker must first obtain the ability to execute low-privileged code on the target system in order to exploit this vulnerability.
How severe is CVE-2023-32522?
CVE-2023-32522 has a CVSS score of 8.1/10 (HIGH severity). The EPSS model estimates a 3.32% probability of exploitation in the next 30 days.
How do I fix CVE-2023-32522?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-32522?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST