CVE-2023-33374

CRITICALCVSS 9.8/10EPSS 1.32%

Last modified

CVE-2023-33374 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. Connected IO v2.1.0 and prior has a command as part of its communication protocol allowing the management platform to specify arbitrary OS commands for devices to execute. Attackers abusing this dangerous functionality may issue all devices OS commands to execute, resulting in arbitrary remote command execution.. EPSS estimates a 1.32% chance of exploitation in the next 30 days.

Description

Connected IO v2.1.0 and prior has a command as part of its communication protocol allowing the management platform to specify arbitrary OS commands for devices to execute. Attackers abusing this dangerous functionality may issue all devices OS commands to execute, resulting in arbitrary remote command execution.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.32%

67.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ConnectedioConnected Io<= 2.1.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-33374?
Connected IO v2.1.0 and prior has a command as part of its communication protocol allowing the management platform to specify arbitrary OS commands for devices to execute. Attackers abusing this dangerous functionality may issue all devices OS commands to execute, resulting in arbitrary remote command execution.
How severe is CVE-2023-33374?
CVE-2023-33374 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 1.32% probability of exploitation in the next 30 days.
How do I fix CVE-2023-33374?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-33374?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST