CVE-2023-33950

HIGHCVSS 7.5/10EPSS 0.92%

Last modified

CVE-2023-33950 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. Pattern Redirects in Liferay Portal 7.4.3.48 through 7.4.3.76, and Liferay DXP 7.4 update 48 through 76 allows regular expressions that are vulnerable to ReDoS attacks to be used as patterns, which allows remote attackers to consume an excessive amount of server resources via crafted request URLs.. EPSS estimates a 0.92% chance of exploitation in the next 30 days.

Description

Pattern Redirects in Liferay Portal 7.4.3.48 through 7.4.3.76, and Liferay DXP 7.4 update 48 through 76 allows regular expressions that are vulnerable to ReDoS attacks to be used as patterns, which allows remote attackers to consume an excessive amount of server resources via crafted request URLs.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.92%

55.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersionsUpdate
LiferayDigital Experience Platform7.4Update48
LiferayLiferay Portal>= 7.4.3.48, <= 7.4.3.76

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-33950?
Pattern Redirects in Liferay Portal 7.4.3.48 through 7.4.3.76, and Liferay DXP 7.4 update 48 through 76 allows regular expressions that are vulnerable to ReDoS attacks to be used as patterns, which allows remote attackers to consume an excessive amount of server resources via crafted request URLs.
How severe is CVE-2023-33950?
CVE-2023-33950 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.92% probability of exploitation in the next 30 days.
How do I fix CVE-2023-33950?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-33950?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST