CVE-2023-41929

Name: CVE-2023-41929
Creator: NVD / NIST
Published: 2023-09-18T12:15:07.47+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 7.3/10EPSS 0.18%

Last modified Jun 17, 2026

CVE-2023-41929 is a high-severity vulnerability rated 7.3/10 on the CVSS scale. A DLL hijacking vulnerability in Samsung Memory Card & UFD Authentication Utility PC Software before 1.0.1 could allow a local attacker to escalate privileges. (An attacker must already have user privileges on Windows to exploit this vulnerability.). EPSS estimates a 0.18% chance of exploitation in the next 30 days.

Description

A DLL hijacking vulnerability in Samsung Memory Card & UFD Authentication Utility PC Software before 1.0.1 could allow a local attacker to escalate privileges. (An attacker must already have user privileges on Windows to exploit this vulnerability.)

Metrics

CVSS 3.1

7.3/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:R/S:U/C:H/I:H/A:H

EPSS Probability

0.18%

7.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Vendor	Product	Versions
Samsung	Memory Card \& Ufd Authentication	< 1.0.1

References

https://semiconductor.samsung.com/support/quality-support/product-security-updates/Vendor Advisory
https://semiconductor.samsung.com/support/quality-support/product-security-updates/Vendor Advisory

Timeline

Published: Sep 18, 2023
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2023-41929?

How severe is CVE-2023-41929?

CVE-2023-41929 has a CVSS score of 7.3/10 (HIGH severity). The EPSS model estimates a 0.18% probability of exploitation in the next 30 days.

How do I fix CVE-2023-41929?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-41929?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST