CVE-2023-41974

HIGHCVSS 7.8/10Actively ExploitedEPSS 1.41%

Last modified

CVE-2023-41974 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. A use-after-free issue was addressed with improved memory management. This issue is fixed in iOS 17 and iPadOS 17, iOS 15.8.7 and iPadOS 15.8.7. CISA has confirmed active exploitation in the wild. EPSS estimates a 1.41% chance of exploitation in the next 30 days.

Description

A use-after-free issue was addressed with improved memory management. This issue is fixed in iOS 17 and iPadOS 17, iOS 15.8.7 and iPadOS 15.8.7. An app may be able to execute arbitrary code with kernel privileges.

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
1.41%

69.2th percentile

Probability of exploitation in the next 30 days. Learn more

Exploitation Status

This vulnerability is listed in CISA’s Known Exploited Vulnerabilities catalog, confirming active exploitation in the wild. Federal agencies must remediate by .

Weakness Enumeration

Affected Software

VendorProductVersions
AppleIpados< 15.8.7
AppleIpados>= 16.0, < 17.0
AppleIphone Os< 15.8.7
AppleIphone Os>= 16.0, < 17.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2023-41974?
A use-after-free issue was addressed with improved memory management. This issue is fixed in iOS 17 and iPadOS 17, iOS 15.8.7 and iPadOS 15.8.7. An app may be able to execute arbitrary code with kernel privileges.
How severe is CVE-2023-41974?
CVE-2023-41974 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 1.41% probability of exploitation in the next 30 days. This vulnerability is listed in CISA's Known Exploited Vulnerabilities catalog.
How do I fix CVE-2023-41974?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-41974?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST