CVE-2023-4204

CRITICALCVSS 9.8/10EPSS 0.34%

Last modified

CVE-2023-4204 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. NPort IAW5000A-I/O Series firmware version v2.2 and prior is affected by a hardcoded credential vulnerabilitywhich poses a potential risk to the security and integrity of the affected device. This vulnerability is attributed to the presence of a hardcoded key, which could potentially facilitate firmware manipulation. . EPSS estimates a 0.34% chance of exploitation in the next 30 days.

Description

NPort IAW5000A-I/O Series firmware version v2.2 and prior is affected by a hardcoded credential vulnerabilitywhich poses a potential risk to the security and integrity of the affected device. This vulnerability is attributed to the presence of a hardcoded key, which could potentially facilitate firmware manipulation.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.34%

25.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
MoxaNport Iaw5000a-I\/O Firmware<= 2.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-4204?
NPort IAW5000A-I/O Series firmware version v2.2 and prior is affected by a hardcoded credential vulnerabilitywhich poses a potential risk to the security and integrity of the affected device. This vulnerability is attributed to the presence of a hardcoded key, which could potentially facilitate firmware manipulation.
How severe is CVE-2023-4204?
CVE-2023-4204 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 0.34% probability of exploitation in the next 30 days.
How do I fix CVE-2023-4204?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-4204?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST