CVE-2023-43624

MEDIUMCVSS 5.5/10EPSS 0.19%

Last modified

CVE-2023-43624 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. CX-Designer Ver.3.740 and earlier (included in CX-One CXONE-AL[][]D-V4) contains an improper restriction of XML external entity reference (XXE) vulnerability. If a user opens a specially crafted project file created by an attacker, sensitive information in the file system where CX-Designer is installed may be disclosed.. EPSS estimates a 0.19% chance of exploitation in the next 30 days.

Description

CX-Designer Ver.3.740 and earlier (included in CX-One CXONE-AL[][]D-V4) contains an improper restriction of XML external entity reference (XXE) vulnerability. If a user opens a specially crafted project file created by an attacker, sensitive information in the file system where CX-Designer is installed may be disclosed.

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:N/A:N

EPSS Probability
0.19%

9.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
OmromCx-Designer<= 3.740

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-43624?
CX-Designer Ver.3.740 and earlier (included in CX-One CXONE-AL[][]D-V4) contains an improper restriction of XML external entity reference (XXE) vulnerability. If a user opens a specially crafted project file created by an attacker, sensitive information in the file system where CX-Designer is installed may be disclosed.
How severe is CVE-2023-43624?
CVE-2023-43624 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.19% probability of exploitation in the next 30 days.
How do I fix CVE-2023-43624?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-43624?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST