CVE-2023-7216

MEDIUMCVSS 5.3/10EPSS 0.90%

Last modified

CVE-2023-7216 is a medium-severity vulnerability rated 5.3/10 on the CVSS scale. A path traversal vulnerability was found in the CPIO utility. This issue could allow a remote unauthenticated attacker to trick a user into opening a specially crafted archive. EPSS estimates a 0.90% chance of exploitation in the next 30 days.

Description

A path traversal vulnerability was found in the CPIO utility. This issue could allow a remote unauthenticated attacker to trick a user into opening a specially crafted archive. During the extraction process, the archiver could follow symlinks outside of the intended directory, which allows files to be written in arbitrary directories through symlinks.

Metrics

CVSS 3.1
5.3/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:L/I:L/A:L

EPSS Probability
0.90%

55.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GnuCpioAll versions
RedhatEnterprise Linux7.0
RedhatEnterprise Linux8.0
RedhatEnterprise Linux9.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2023-7216?
A path traversal vulnerability was found in the CPIO utility. This issue could allow a remote unauthenticated attacker to trick a user into opening a specially crafted archive. During the extraction process, the archiver could follow symlinks outside of the intended directory, which allows files to be written in arbitrary directories through symlinks.
How severe is CVE-2023-7216?
CVE-2023-7216 has a CVSS score of 5.3/10 (MEDIUM severity). The EPSS model estimates a 0.90% probability of exploitation in the next 30 days.
How do I fix CVE-2023-7216?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2023-7216?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST