CVE-2024-0736

HIGHCVSS 7.5/10EPSS 0.98%

Last modified

CVE-2024-0736 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. A vulnerability classified as problematic has been found in EFS Easy File Sharing FTP 3.6. This affects an unknown part of the component Login. EPSS estimates a 0.98% chance of exploitation in the next 30 days.

Description

A vulnerability classified as problematic has been found in EFS Easy File Sharing FTP 3.6. This affects an unknown part of the component Login. The manipulation of the argument password leads to denial of service. It is possible to initiate the attack remotely. The exploit has been disclosed to the public and may be used. The associated identifier of this vulnerability is VDB-251559.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.98%

57.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
Easy File Sharing Ftp Server ProjectEasy File Sharing Ftp Server3.6

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2024-0736?
A vulnerability classified as problematic has been found in EFS Easy File Sharing FTP 3.6. This affects an unknown part of the component Login. The manipulation of the argument password leads to denial of service. It is possible to initiate the attack remotely. The exploit has been disclosed to the public and may be used. The associated identifier of this vulnerability is VDB-251559.
How severe is CVE-2024-0736?
CVE-2024-0736 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.98% probability of exploitation in the next 30 days.
How do I fix CVE-2024-0736?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-0736?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST