CVE-2024-10219

MEDIUMCVSS 6.5/10EPSS 0.40%

Last modified

CVE-2024-10219 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. An issue has been discovered in GitLab CE/EE affecting all versions from 15.6 before 18.0.6, 18.1 before 18.1.4, and 18.2 before 18.2.2 that under certain conditions could have allowed authenticated users to bypass access controls and download private artifacts by accessing specific API endpoints.. EPSS estimates a 0.40% chance of exploitation in the next 30 days.

Description

An issue has been discovered in GitLab CE/EE affecting all versions from 15.6 before 18.0.6, 18.1 before 18.1.4, and 18.2 before 18.2.2 that under certain conditions could have allowed authenticated users to bypass access controls and download private artifacts by accessing specific API endpoints.

Metrics

CVSS 3.1
6.5/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.40%

31.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GitlabGitlab>= 15.6.0, < 18.0.6
GitlabGitlab>= 18.1.0, < 18.1.4
GitlabGitlab>= 18.2.0, < 18.2.2

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-10219?
An issue has been discovered in GitLab CE/EE affecting all versions from 15.6 before 18.0.6, 18.1 before 18.1.4, and 18.2 before 18.2.2 that under certain conditions could have allowed authenticated users to bypass access controls and download private artifacts by accessing specific API endpoints.
How severe is CVE-2024-10219?
CVE-2024-10219 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.40% probability of exploitation in the next 30 days.
How do I fix CVE-2024-10219?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-10219?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST