CVE-2024-27378

HIGHCVSS 7.1/10EPSS 0.19%

Last modified

CVE-2024-27378 is a high-severity vulnerability rated 7.1/10 on the CVSS scale. An issue was discovered in Samsung Mobile Processor Exynos 980, Exynos 850, Exynos 1280, Exynos 1380, and Exynos 1330. In the function slsi_send_action_frame_cert(), there is no input validation check on len coming from userspace, which can lead to a heap over-read.. EPSS estimates a 0.19% chance of exploitation in the next 30 days.

Description

An issue was discovered in Samsung Mobile Processor Exynos 980, Exynos 850, Exynos 1280, Exynos 1380, and Exynos 1330. In the function slsi_send_action_frame_cert(), there is no input validation check on len coming from userspace, which can lead to a heap over-read.

Metrics

CVSS 3.1
7.1/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:N/A:H

EPSS Probability
0.19%

8.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SamsungExynos 980 FirmwareAll versions
SamsungExynos 850 FirmwareAll versions
SamsungExynos 1280 FirmwareAll versions
SamsungExynos 1380 FirmwareAll versions
SamsungExynos 1330 FirmwareAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2024-27378?
An issue was discovered in Samsung Mobile Processor Exynos 980, Exynos 850, Exynos 1280, Exynos 1380, and Exynos 1330. In the function slsi_send_action_frame_cert(), there is no input validation check on len coming from userspace, which can lead to a heap over-read.
How severe is CVE-2024-27378?
CVE-2024-27378 has a CVSS score of 7.1/10 (HIGH severity). The EPSS model estimates a 0.19% probability of exploitation in the next 30 days.
How do I fix CVE-2024-27378?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-27378?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST