CVE-2024-28777

HIGHCVSS 8.8/10EPSS 0.56%

Last modified

CVE-2024-28777 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. IBM Cognos Controller 11.0.0 through 11.0.1 FP3 and IBM Controller 11.1.0 is vulnerable to unrestricted deserialization. This vulnerability allows users to execute arbitrary code, escalate privileges, or cause denial of service attacks by exploiting the unrestricted deserialization of types in the application.. EPSS estimates a 0.56% chance of exploitation in the next 30 days.

Description

IBM Cognos Controller 11.0.0 through 11.0.1 FP3 and IBM Controller 11.1.0 is vulnerable to unrestricted deserialization. This vulnerability allows users to execute arbitrary code, escalate privileges, or cause denial of service attacks by exploiting the unrestricted deserialization of types in the application.

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.56%

42.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
IbmCognos Controller>= 11.0.0, < 11.0.1.4
IbmController11.1.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-28777?
IBM Cognos Controller 11.0.0 through 11.0.1 FP3 and IBM Controller 11.1.0 is vulnerable to unrestricted deserialization. This vulnerability allows users to execute arbitrary code, escalate privileges, or cause denial of service attacks by exploiting the unrestricted deserialization of types in the application.
How severe is CVE-2024-28777?
CVE-2024-28777 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 0.56% probability of exploitation in the next 30 days.
How do I fix CVE-2024-28777?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-28777?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST