CVE-2024-3221

HIGHCVSS 8.8/10EPSS 0.67%

Last modified

CVE-2024-3221 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. A vulnerability classified as critical was found in SourceCodester PHP Task Management System 1.0. This vulnerability affects unknown code of the file attendance-info.php. EPSS estimates a 0.67% chance of exploitation in the next 30 days.

Description

A vulnerability classified as critical was found in SourceCodester PHP Task Management System 1.0. This vulnerability affects unknown code of the file attendance-info.php. The manipulation of the argument user_id leads to sql injection. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used. VDB-259066 is the identifier assigned to this vulnerability.

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.67%

47.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
MayurikPhp Task Management System1.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-3221?
A vulnerability classified as critical was found in SourceCodester PHP Task Management System 1.0. This vulnerability affects unknown code of the file attendance-info.php. The manipulation of the argument user_id leads to sql injection. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used. VDB-259066 is the identifier assigned to this vulnerability.
How severe is CVE-2024-3221?
CVE-2024-3221 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 0.67% probability of exploitation in the next 30 days.
How do I fix CVE-2024-3221?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-3221?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST