CVE-2024-3259

HIGHCVSS 7.2/10EPSS 0.76%

Last modified

CVE-2024-3259 is a high-severity vulnerability rated 7.2/10 on the CVSS scale. A vulnerability was found in SourceCodester Internship Portal Management System 1.0. It has been declared as critical. EPSS estimates a 0.76% chance of exploitation in the next 30 days.

Description

A vulnerability was found in SourceCodester Internship Portal Management System 1.0. It has been declared as critical. This vulnerability affects unknown code of the file admin/delete_activity.php. The manipulation of the argument activity_id leads to sql injection. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used. The identifier of this vulnerability is VDB-259108.

Metrics

CVSS 3.1
7.2/10

CVSS:3.1/AV:N/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.76%

50.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ChatikoboInternship Portal Management System1.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-3259?
A vulnerability was found in SourceCodester Internship Portal Management System 1.0. It has been declared as critical. This vulnerability affects unknown code of the file admin/delete_activity.php. The manipulation of the argument activity_id leads to sql injection. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used. The identifier of this vulnerability is VDB-259108.
How severe is CVE-2024-3259?
CVE-2024-3259 has a CVSS score of 7.2/10 (HIGH severity). The EPSS model estimates a 0.76% probability of exploitation in the next 30 days.
How do I fix CVE-2024-3259?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-3259?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST