CVE-2024-33985

MEDIUMCVSS 6.1/10EPSS 0.29%

Last modified

CVE-2024-33985 is a medium-severity vulnerability rated 6.1/10 on the CVSS scale. Cross-Site Scripting (XSS) vulnerability in School Attendance Monitoring System and School Event Management System affecting version 1.0. An attacker could create a specially crafted URL and send it to a victim to obtain details of their session cookie via the 'View' parameter in '/course/index.php'.. EPSS estimates a 0.29% chance of exploitation in the next 30 days.

Description

Cross-Site Scripting (XSS) vulnerability in School Attendance Monitoring System and School Event Management System affecting version 1.0. An attacker could create a specially crafted URL and send it to a victim to obtain details of their session cookie via the 'View' parameter in '/course/index.php'.

Metrics

CVSS 3.1
6.1/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:R/S:C/C:L/I:L/A:N

EPSS Probability
0.29%

20.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
JanobeSchool Attendence Monitoring System1.0
JanobeSchool Event Management System1.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-33985?
Cross-Site Scripting (XSS) vulnerability in School Attendance Monitoring System and School Event Management System affecting version 1.0. An attacker could create a specially crafted URL and send it to a victim to obtain details of their session cookie via the 'View' parameter in '/course/index.php'.
How severe is CVE-2024-33985?
CVE-2024-33985 has a CVSS score of 6.1/10 (MEDIUM severity). The EPSS model estimates a 0.29% probability of exploitation in the next 30 days.
How do I fix CVE-2024-33985?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-33985?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST