CVE-2024-35355

Name: CVE-2024-35355
Creator: NVD / NIST
Published: 2024-05-30T16:15:10.503+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

CRITICALCVSS 9.8/10EPSS 0.65%

Last modified Jun 17, 2026

CVE-2024-35355 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. A vulnerability has been discovered in Diño Physics School Assistant version 2.3. The vulnerability impacts an unidentified code within the file /classes/Master.php?f=delete_category. EPSS estimates a 0.65% chance of exploitation in the next 30 days.

Description

A vulnerability has been discovered in Diño Physics School Assistant version 2.3. The vulnerability impacts an unidentified code within the file /classes/Master.php?f=delete_category. Manipulating the argument id can result in SQL injection.

Metrics

CVSS 3.1

9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

0.65%

46.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-89

Affected Software

Vendor	Product	Versions
Dino Physics School Assistant Project	Dino Physics School Assistant	2.3

References

https://vuln.pentester.stream/pentester-vulnerability-research/post/2298724/vuln10-blind-sql-injection-time-basedExploit, Third Party Advisory
https://vuln.pentester.stream/pentester-vulnerability-research/post/2298724/vuln10-blind-sql-injection-time-basedExploit, Third Party Advisory

Timeline

Published: May 30, 2024
Last Modified: Jun 17, 2026
Status: Analyzed

Frequently Asked Questions

What is CVE-2024-35355?

How severe is CVE-2024-35355?

CVE-2024-35355 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 0.65% probability of exploitation in the next 30 days.

How do I fix CVE-2024-35355?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-35355?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST