CVE-2024-39600

MEDIUMCVSS 4.2/10EPSS 0.15%

Last modified

CVE-2024-39600 is a medium-severity vulnerability rated 4.2/10 on the CVSS scale. Under certain conditions, the memory of SAP GUI for Windows contains the password used to log on to an SAP system, which might allow an attacker to get hold of the password and impersonate the affected user. As a result, it has a high impact on the confidentiality but there is no impact on the integrity and availability.. EPSS estimates a 0.15% chance of exploitation in the next 30 days.

Description

Under certain conditions, the memory of SAP GUI for Windows contains the password used to log on to an SAP system, which might allow an attacker to get hold of the password and impersonate the affected user. As a result, it has a high impact on the confidentiality but there is no impact on the integrity and availability.

Metrics

CVSS 3.1
4.2/10

CVSS:3.1/AV:L/AC:L/PR:H/UI:R/S:U/C:H/I:N/A:N

EPSS Probability
0.15%

4.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SapGui For Windows8.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-39600?
Under certain conditions, the memory of SAP GUI for Windows contains the password used to log on to an SAP system, which might allow an attacker to get hold of the password and impersonate the affected user. As a result, it has a high impact on the confidentiality but there is no impact on the integrity and availability.
How severe is CVE-2024-39600?
CVE-2024-39600 has a CVSS score of 4.2/10 (MEDIUM severity). The EPSS model estimates a 0.15% probability of exploitation in the next 30 days.
How do I fix CVE-2024-39600?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-39600?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST