CVE-2024-45833

MEDIUMCVSS 6.5/10EPSS 0.33%

Last modified

CVE-2024-45833 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. Mattermost Mobile Apps versions <=2.18.0 fail to disable autocomplete during login while typing the password and visible password is selected, which allows the password to get saved in the dictionary when the user has Swiftkey as the default keyboard, the masking is off and the password contains a special character... EPSS estimates a 0.33% chance of exploitation in the next 30 days.

Description

Mattermost Mobile Apps versions <=2.18.0 fail to disable autocomplete during login while typing the password and visible password is selected, which allows the password to get saved in the dictionary when the user has Swiftkey as the default keyboard, the masking is off and the password contains a special character..

Metrics

CVSS 3.1
6.5/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.33%

24.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
MattermostMattermost Mobile< 2.19.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2024-45833?
Mattermost Mobile Apps versions <=2.18.0 fail to disable autocomplete during login while typing the password and visible password is selected, which allows the password to get saved in the dictionary when the user has Swiftkey as the default keyboard, the masking is off and the password contains a special character..
How severe is CVE-2024-45833?
CVE-2024-45833 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.33% probability of exploitation in the next 30 days.
How do I fix CVE-2024-45833?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-45833?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST