CVE-2024-4660

HIGHCVSS 7.5/10EPSS 0.49%

Last modified

CVE-2024-4660 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. An issue has been discovered in GitLab EE affecting all versions starting from 11.2 before 17.1.7, all versions starting from 17.2 before 17.2.5, all versions starting from 17.3 before 17.3.2. It was possible for a guest to read the source code of a private project by using group templates.. EPSS estimates a 0.49% chance of exploitation in the next 30 days.

Description

An issue has been discovered in GitLab EE affecting all versions starting from 11.2 before 17.1.7, all versions starting from 17.2 before 17.2.5, all versions starting from 17.3 before 17.3.2. It was possible for a guest to read the source code of a private project by using group templates.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.49%

38.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GitlabGitlab>= 11.2.0, < 17.1.7
GitlabGitlab>= 17.2.0, < 17.2.5
GitlabGitlab>= 17.3.0, < 17.3.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2024-4660?
An issue has been discovered in GitLab EE affecting all versions starting from 11.2 before 17.1.7, all versions starting from 17.2 before 17.2.5, all versions starting from 17.3 before 17.3.2. It was possible for a guest to read the source code of a private project by using group templates.
How severe is CVE-2024-4660?
CVE-2024-4660 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.49% probability of exploitation in the next 30 days.
How do I fix CVE-2024-4660?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-4660?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST