CVE-2024-53017

Name: CVE-2024-53017
Creator: NVD / NIST
Published: 2025-06-03T06:15:24.793+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

MEDIUMCVSS 6.6/10EPSS 0.08%

Last modified Jun 17, 2026

CVE-2024-53017 is a medium-severity vulnerability rated 6.6/10 on the CVSS scale. Memory corruption while handling test pattern generator IOCTL command.. EPSS estimates a 0.08% chance of exploitation in the next 30 days.

Description

Memory corruption while handling test pattern generator IOCTL command.

Metrics

CVSS 3.1

6.6/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

EPSS Probability

0.08%

0.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-823

Affected Software

Vendor	Product	Versions
Qualcomm	Sdm429w Firmware	All versions
Qualcomm	Snapdragon 429 Mobile Platform Firmware	All versions
Qualcomm	Wcn3620 Firmware	All versions
Qualcomm	Wcn3660b Firmware	All versions

References

https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.htmlVendor Advisory

Timeline

Published: Jun 3, 2025
Last Modified: Jun 17, 2026
Status: Analyzed

Frequently Asked Questions

What is CVE-2024-53017?

Memory corruption while handling test pattern generator IOCTL command.

How severe is CVE-2024-53017?

CVE-2024-53017 has a CVSS score of 6.6/10 (MEDIUM severity). The EPSS model estimates a 0.08% probability of exploitation in the next 30 days.

How do I fix CVE-2024-53017?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-53017?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST