CVE-2024-58055

HIGHCVSS 7.8/10EPSS 0.22%

Last modified

CVE-2024-58055 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. In the Linux kernel, the following vulnerability has been resolved: usb: gadget: f_tcm: Don't free command immediately Don't prematurely free the command. Wait for the status completion of the sense status. EPSS estimates a 0.22% chance of exploitation in the next 30 days.

Description

In the Linux kernel, the following vulnerability has been resolved: usb: gadget: f_tcm: Don't free command immediately Don't prematurely free the command. Wait for the status completion of the sense status. It can be freed then. Otherwise we will double-free the command.

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.22%

12.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxLinux Kernel>= 4.6, < 5.4.291
LinuxLinux Kernel>= 5.5, < 5.10.235
LinuxLinux Kernel>= 5.11, < 5.15.179
LinuxLinux Kernel>= 5.16, < 6.1.129
LinuxLinux Kernel>= 6.2, < 6.6.76
LinuxLinux Kernel>= 6.7, < 6.12.13
LinuxLinux Kernel>= 6.13, < 6.13.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2024-58055?
In the Linux kernel, the following vulnerability has been resolved: usb: gadget: f_tcm: Don't free command immediately Don't prematurely free the command. Wait for the status completion of the sense status. It can be freed then. Otherwise we will double-free the command.
How severe is CVE-2024-58055?
CVE-2024-58055 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.22% probability of exploitation in the next 30 days.
How do I fix CVE-2024-58055?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2024-58055?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST