CVE-2024-8105

MEDIUMCVSS 6.4/10EPSS 0.24%

Last modified

CVE-2024-8105 is a medium-severity vulnerability rated 6.4/10 on the CVSS scale. A vulnerability exists in UEFI implementations that use a hard-coded software-based Platform Key (PK). An attacker in possession of the corresponding PK private key can sign arbitrary UEFI executables or firmware components, causing them to be trusted by affected systems and potentially bypassing UEFI Secure Boot trust validation.. EPSS estimates a 0.24% chance of exploitation in the next 30 days.

Description

A vulnerability exists in UEFI implementations that use a hard-coded software-based Platform Key (PK). An attacker in possession of the corresponding PK private key can sign arbitrary UEFI executables or firmware components, causing them to be trusted by affected systems and potentially bypassing UEFI Secure Boot trust validation.

Metrics

CVSS 3.1
6.4/10

CVSS:3.1/AV:L/AC:H/PR:H/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.24%

15.0th percentile

Probability of exploitation in the next 30 days. Learn more

References

Timeline

Published
Last Modified
Status
Deferred

Frequently Asked Questions

What is CVE-2024-8105?
A vulnerability exists in UEFI implementations that use a hard-coded software-based Platform Key (PK). An attacker in possession of the corresponding PK private key can sign arbitrary UEFI executables or firmware components, causing them to be trusted by affected systems and potentially bypassing UEFI Secure Boot trust validation.
How severe is CVE-2024-8105?
CVE-2024-8105 has a CVSS score of 6.4/10 (MEDIUM severity). The EPSS model estimates a 0.24% probability of exploitation in the next 30 days.
How do I fix CVE-2024-8105?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

How Strix Helps

Related CVEs from 2024

Are you affected by CVE-2024-8105?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST