CVE-2025-12622

HIGHCVSS 7.4/10EPSS 0.75%

Last modified

CVE-2025-12622 is a high-severity vulnerability rated 7.4/10 on the CVSS scale. A vulnerability was determined in Tenda AC10 16.03.10.13. Affected by this vulnerability is the function formSysRunCmd of the file /goform/SysRunCmd. EPSS estimates a 0.75% chance of exploitation in the next 30 days.

Description

A vulnerability was determined in Tenda AC10 16.03.10.13. Affected by this vulnerability is the function formSysRunCmd of the file /goform/SysRunCmd. This manipulation of the argument getui causes buffer overflow. The attack may be initiated remotely. The exploit has been publicly disclosed and may be utilized.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

CVSS 4.0
7.4/10

CVSS:4.0/AV:N/AC:L/AT:N/PR:L/UI:N/VC:H/VI:H/VA:H/SC:N/SI:N/SA:N/E:P/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.75%

50.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
TendaAc10 Firmware16.03.10.13

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-12622?
A vulnerability was determined in Tenda AC10 16.03.10.13. Affected by this vulnerability is the function formSysRunCmd of the file /goform/SysRunCmd. This manipulation of the argument getui causes buffer overflow. The attack may be initiated remotely. The exploit has been publicly disclosed and may be utilized.
How severe is CVE-2025-12622?
CVE-2025-12622 has a CVSS score of 7.4/10 (HIGH severity). The EPSS model estimates a 0.75% probability of exploitation in the next 30 days.
How do I fix CVE-2025-12622?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-12622?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST