CVE-2025-13443

LOWCVSS 2.1/10EPSS 0.20%

Last modified

CVE-2025-13443 is a low-severity vulnerability rated 2.1/10 on the CVSS scale. A vulnerability was detected in macrozheng mall up to 1.0.3. Affected by this issue is the function delete of the file /member/readHistory/delete. EPSS estimates a 0.20% chance of exploitation in the next 30 days.

Description

A vulnerability was detected in macrozheng mall up to 1.0.3. Affected by this issue is the function delete of the file /member/readHistory/delete. Performing manipulation of the argument ids results in improper access controls. Remote exploitation of the attack is possible. The exploit is now public and may be used.

Metrics

CVSS 3.1
6.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:L/I:L/A:N

CVSS 4.0
2.1/10

CVSS:4.0/AV:N/AC:L/AT:N/PR:L/UI:N/VC:N/VI:L/VA:L/SC:N/SI:N/SA:N/E:P/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.20%

10.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
MacrozhengMall<= 1.0.3

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-13443?
A vulnerability was detected in macrozheng mall up to 1.0.3. Affected by this issue is the function delete of the file /member/readHistory/delete. Performing manipulation of the argument ids results in improper access controls. Remote exploitation of the attack is possible. The exploit is now public and may be used.
How severe is CVE-2025-13443?
CVE-2025-13443 has a CVSS score of 2.1/10 (LOW severity). The EPSS model estimates a 0.20% probability of exploitation in the next 30 days.
How do I fix CVE-2025-13443?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-13443?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST