CVE-2025-2002

MEDIUMCVSS 4/10EPSS 0.16%

Last modified

CVE-2025-2002 is a medium-severity vulnerability rated 4/10 on the CVSS scale. CWE-532: Insertion of Sensitive Information into Log Files vulnerability exists that could cause the disclosure of FTP server credentials when the FTP server is deployed, and the device is placed in debug mode by an administrative user and the debug files are exported from the device.. EPSS estimates a 0.16% chance of exploitation in the next 30 days.

Description

CWE-532: Insertion of Sensitive Information into Log Files vulnerability exists that could cause the disclosure of FTP server credentials when the FTP server is deployed, and the device is placed in debug mode by an administrative user and the debug files are exported from the device.

Metrics

CVSS 3.1
6/10

CVSS:3.1/AV:L/AC:L/PR:H/UI:N/S:C/C:H/I:N/A:N

CVSS 4.0
4/10

CVSS:4.0/AV:L/AC:L/AT:P/PR:H/UI:N/VC:N/VI:N/VA:N/SC:H/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.16%

5.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

References

Timeline

Published
Last Modified
Status
Deferred

Frequently Asked Questions

What is CVE-2025-2002?
CWE-532: Insertion of Sensitive Information into Log Files vulnerability exists that could cause the disclosure of FTP server credentials when the FTP server is deployed, and the device is placed in debug mode by an administrative user and the debug files are exported from the device.
How severe is CVE-2025-2002?
CVE-2025-2002 has a CVSS score of 4/10 (MEDIUM severity). The EPSS model estimates a 0.16% probability of exploitation in the next 30 days.
How do I fix CVE-2025-2002?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-2002?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST