CVE-2025-21735

HIGHCVSS 7.8/10EPSS 0.22%

Last modified

CVE-2025-21735 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. In the Linux kernel, the following vulnerability has been resolved: NFC: nci: Add bounds checking in nci_hci_create_pipe() The "pipe" variable is a u8 which comes from the network. If it's more than 127, then it results in memory corruption in the caller, nci_hci_connect_gate().. EPSS estimates a 0.22% chance of exploitation in the next 30 days.

Description

In the Linux kernel, the following vulnerability has been resolved: NFC: nci: Add bounds checking in nci_hci_create_pipe() The "pipe" variable is a u8 which comes from the network. If it's more than 127, then it results in memory corruption in the caller, nci_hci_connect_gate().

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.22%

13.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxLinux Kernel>= 4.4, < 6.1.129
LinuxLinux Kernel>= 6.2, < 6.6.78
LinuxLinux Kernel>= 6.7, < 6.12.14
LinuxLinux Kernel>= 6.13, < 6.13.3

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2025-21735?
In the Linux kernel, the following vulnerability has been resolved: NFC: nci: Add bounds checking in nci_hci_create_pipe() The "pipe" variable is a u8 which comes from the network. If it's more than 127, then it results in memory corruption in the caller, nci_hci_connect_gate().
How severe is CVE-2025-21735?
CVE-2025-21735 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.22% probability of exploitation in the next 30 days.
How do I fix CVE-2025-21735?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-21735?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST